Alexander Korsunsky

Abstract:

Multi-modal microscopy is a term that refers to combining different imaging and mapping modes applied to the same object in order to obtain complementary information about material structure, function and properties. Alongside the well-established modalities, such as optical microscopy (including using polarised light) and scanning electron microscopy (including EDX and EBSD), multi-modal microscopy includes the use of TEM and STEM, AFM, as well as focused beams of ions (FIB), neutrons and X-rays. The advent of tight (sub-micron) focusing of X-rays has opened up a vast range of possibilities in terms of full field imaging (including tomography), as well as scanning transmission X-ray microscopies (STXM) that can be used in the WAXS or SAXS regimes, and also for spectroscopic analysis (XAS). My particular interest lies in the tight integration of these techniques with materials modelling across the scales. As examples, in my lecture I shall draw on our studies of the structure and thermo-mechanical response of human dental tissues (dentine and enamel); the structure and residual stress of carbon monofilament cores used in SiC fibre composites for aerospace applications; and some studies of materials for Li-ion batteries. In terms of modelling, the use of non-singular solutions will be discussed in the context of dislocation and fracture mechanics, and the use of eigenstrain basis for residual stress analysis will be overviewed.